Summary Page - CITAC workshop

The CITAC one-day workshop was organized on the 21st January 2010 as a post conference event titled "What should you know about metrology & quality requirements to analytical results?" The workshop program included the following lectures:

• "Introduction to metrology and quality in chemistry" by Dr. Ilya Kuselman, INPL, Israel;
• "Different approaches to estimation of measurement uncertainty in analytical chemistry" by Prof. Ivo Leito, University of Tartu, Estonia;
• "Exploiting the potential of reference materials and accompanying information by different laboratories" by Prof. Hendrik Emons, IRMM, European Union;
• "Metrological traceability of measurement results in chemistry: concepts and implementation" by Prof. Paul De Bievre, Consultant, Belgium;
  
• "Metrological traceability in analytical spectrophotometric instrument qualification" by Dr. Jerry D. Messman, Stranaska Scientific LLC, USA; and
• "A practical guide to chemical metrology and pharmaceutical quality" by Dr. William Koch, USP, USA.

Every lecture was planned for 45 min, while the next 15 min were used for questions and discussions.

This workshop was intended for:

• Laboratory personnel in analytical (quality control) and R&D laboratories;
• Quality assurance personnel involved in reviewing analytical data and validation studies;
• Projects coordinators and analytical laboratory managers;
• Metrologists specialized in chemistry.
  

Since the lecturers were already familiar to the audience from the conference, the interactions between them were simple, helpful and creative. The workshop participants were very satisfied by such a possibility to learn, to ask and to receive answers directly from the leading specialists in Metrology in Chemistry - the CITAC members.

Dr. Ilya Kuselman,
INPL, Israel